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$99.50
81. Monte Carlo Modeling for Electron
$89.50
82. Scanning Force Microscopy: With
$110.00 $70.00
83. Molecules and Clusters in Intense
$85.00
84. Atomic Force Microscopy/Scanning
$205.00 $176.80
85. X-Ray Lasers 2002: 8th International
list($60.00)
86. Electron Microprobe Analysis
$225.00 $179.95
87. Industrial Applications of Electron
$84.00 $80.00
88. Distributed Feedback Semiconductor
list($29.95)
89. Interpretation of Electron Ionization
list($52.95)
90. Electron Energy Loss Spectroscopy
$76.46 list($89.95)
91. Laser Physics at Relativistic
$169.00 $134.88
92. Modern Developments and Applications
$67.00 $25.00
93. Scanning Electron Microscopy,
$46.00 $38.97
94. Problems in Laser Physics
$250.00 $14.29
95. Electron Microscopy and Analysis
$114.00
96. Sensors and Microsystems: Proceedings
$158.66 list($199.00)
97. High Power Laser Interactions
$119.95 $85.00
98. PCR/RT- PCR in-situ Light and
$152.00 $131.48
99. High-Field Science
$112.00 $106.37
100. Introduction to Electron Holography

81. Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical and Imaging Sciences)
by David C. Joy
list price: $99.50
our price: $99.50
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Asin: 0195088743
Catlog: Book (1995-04-01)
Publisher: Oxford University Press
Sales Rank: 1150598
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Book Description

This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid.Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis.The computer code is given in a fully annotated format so that it may be readily modified for specific problems.Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature. ... Read more


82. Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces (Oxford Series in Optical and Imaging Sciences, No 5)
by Dror Sarid
list price: $89.50
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Asin: 019509204X
Catlog: Book (1994-08-01)
Publisher: Oxford University Press
Sales Rank: 676558
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Book Description

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media.It has also shown great potential in areas such as the semiconductor and optical quality control industries.Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. ... Read more


83. Molecules and Clusters in Intense Laser Fields
list price: $110.00
our price: $110.00
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Asin: 0521772400
Catlog: Book (2001-06-28)
Publisher: Cambridge University Press
Sales Rank: 1549583
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Book Description

This book provides a thorough introduction to the physics of molecules and clusters in intense laser fields.It presents both theoretical and experimental aspects of the subject, and covers new research in the area of clusters in intense laser fields.The book discusses femto second pulse production and diagnostics, and covers diatomic and polyatomic molecules, as well as coherent control.This book will be of interest to graduate students and researchers in atomic, molecular and optical physics.It will also be suitable as a reference text for advanced physics courses. ... Read more


84. Atomic Force Microscopy/Scanning Tunneling Microscopy 2
by Samuel H. Cohen, Marcia L. Lightbody, Natick Research, Development, and E U.S. Army Soldier Systems Command
list price: $85.00
our price: $85.00
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Asin: 030645596X
Catlog: Book (1997-03-01)
Publisher: Plenum Publishing Corporation
Sales Rank: 1624289
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85. X-Ray Lasers 2002: 8th International Conference on X-Ray Lasers : Aspen, Colorado 27-31 May 2002 (Aip Conference Proceedings, 641)
by Colo.) International Conference on X-Ray Lasers 2002Aspen, J. J. Rocca, J. Dunn, S. Suckewer, Jorge J. Rocca, James Dunn, National Science Foundation
list price: $205.00
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Asin: 0735400962
Catlog: Book (2002-11-01)
Publisher: AIP Press
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86. Electron Microprobe Analysis
by S. J. B. Reed
list price: $60.00
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Asin: 052159944X
Catlog: Book (1997-07-10)
Publisher: Cambridge University Press
Sales Rank: 1161536
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Book Description

This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers. ... Read more


87. Industrial Applications of Electron Microscopy
by Zhigang R. Li
list price: $225.00
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Asin: 0824708288
Catlog: Book (2002-12-01)
Publisher: Marcel Dekker
Sales Rank: 1671404
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88. Distributed Feedback Semiconductor Lasers (Iee Circuits, Devices and Systems Series, 10)
by John E. Carroll, James Whiteaway, Dick Plumb, John Carroll
list price: $84.00
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Asin: 0819426601
Catlog: Book (1998-08-01)
Publisher: Institute of Electrical & Electronics Enginee
Sales Rank: 343078
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89. Interpretation of Electron Ionization Data: The Odd Book
by Stephen Schrader
list price: $29.95
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Asin: 0966081366
Catlog: Book (2001-06-01)
Publisher: Global View Pub
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90. Electron Energy Loss Spectroscopy
by R. Brydson
list price: $52.95
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Asin: 1859961347
Catlog: Book (2001-10-15)
Publisher: Springer-Verlag Telos
Sales Rank: 1367264
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Book Description

"Electron Energy Loss Spectroscopy" is an introductory practical guide to the use of electron energy loss spectroscopy (EELS) in the laboratory. EELS is a technique used in the transmission electron microscope, in materials or physical science laboratories, to examine the microstructure and characteristics of materials. "Electron Energy Loss Spectroscopy" is an ideal starting point for newcomers to the area, and introduces the subject and explains the techniques involved. It serves as a practical guide for graduates and researchers with little or no experience of the EELS technique. This book uses clear explanations to allow first-time users to fully understand the technique and to appreciate how useful results can be obtained. ... Read more


91. Laser Physics at Relativistic Intensities
by A. V. Borovsky, A. L. Galkin, A. B. Shiryaev, T. Auguste
list price: $89.95
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Asin: 3540434461
Catlog: Book (2003-05-16)
Publisher: Springer-Verlag
Sales Rank: 1667511
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Book Description

Laser Physics at Relativistic Intensities is a comprehensive presentation for both advanced scientists and students as an introduction. Nonlinear interactions of relativistically intense electromagnetic radiation and matter are considered. New basic laser pulse propagation regimes, including relativistic and charge-displacement self-channeling and instabilities of electromagnetic radiation in plasmas (Raman scattering by plasmons, harmonics excitation, collective Compton effect), are treated using fully nonlinear models, analytical techniques, and simulations. Material is presented on both qualitative and mathematically formal levels. Simulation results are extensively illustrated. Most of the results described were obtained in recent years. ... Read more


92. Modern Developments and Applications in Microbeam Analysis (Mikrochimica Acta. Supplementum, 15)
by G. Love, W. A. P. Nicholson, A. Armigliato
list price: $169.00
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Asin: 3211831061
Catlog: Book (1998-11-15)
Publisher: Springer-Verlag Telos
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Book Description

The European Microanalysis Society held its Fifth Workshop in Torquay in May 1997. This volume includes the revised presentations of 12 tutorials and 50 papers from leadings experts in the fields covering the following main topics: X-ray spectrometry, analytical electron microscopy, surface studies, bulk analysis, fundamental parameters. ... Read more


93. Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
by Charles E. Lyman
list price: $67.00
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Asin: 0306435918
Catlog: Book (1990-10-01)
Publisher: Plenum Publishing Corporation
Sales Rank: 1240362
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94. Problems in Laser Physics
by G. Cerullo, S.. Longhi, M. Nisoli, S. Stagira, O. Svelto
list price: $46.00
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Asin: 030646649X
Catlog: Book (2001-08-01)
Publisher: Kluwer Academic/Plenum Publishers
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Book Description

This book presents the first comprehensive collection of solved problems in laser physics covering both fundamental and applied aspects of laser science and technology. The framework of the book, including structuring of topics and notations, closely follows that adopted in the Principles of Laser book by Professor O. Svelto. The collection of problems presented in this book appears therefore a natural complement to Svelto's textbook for testing and developing the skills acquired in the reading of the theory; however, it may also be a useful support to any general textbook on laser physics, wherein problems are usually not solved in detail. We remark that this is, to our knowledge, the first book to provide a complete and satisfactory set of solved problems in such a highly developing field of science and technology. The problems fall mainly into three distinct categories: (i) numerical/applied problems, which help the reader to become confident and familiar with the basic concepts and methods of laser physics, and to acquire a feeling for numerical parameters entering in real-world laser systems; (ii) complementary problems, that present in detail demonstrations of some analytical parts not given in the textbook; and (iii) advanced problems, aimed either to provide a deeper understanding of the subject or to cover more recent developments in the field.Audience: This book is primarily intended for undergraduate and graduate students in physics, engineering, and chemistry. However, it may also be a useful tool for industrial professionals working in the field of laser technologies and laser applications, as well as for researchers interested in basic aspects of real-world lasers and related fields. ... Read more


95. Electron Microscopy and Analysis 1995: Proceedings of the Institute of Physics Electronic Microscopy and Analysis Group Conference, University of Birm ... titute of Physics Conference Series , No 147)
by David Cherns, D. Cherns, Institute of Physics, Royal Microscopical Society
list price: $250.00
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Asin: 0750303573
Catlog: Book (1996-02-01)
Publisher: Institute of Physics Publishing
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96. Sensors and Microsystems: Proceedings of the 3rd Italian Conference Genova, Italy 11-18 February 1998
by C. Di Natale, A. D'Amico, G. Sberveglieri, ITALIAN CONFERENCE ON SENSORS AND MICROS
list price: $114.00
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Asin: 9810237596
Catlog: Book (1999-05-01)
Publisher: World Scientific Publishing Company
Sales Rank: 2896318
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97. High Power Laser Interactions
by Jean Robieux
list price: $199.00
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Asin: 189829867X
Catlog: Book (2000-04-04)
Publisher: Springer Verlag
Sales Rank: 2817057
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98. PCR/RT- PCR in-situ Light and Electron Microscopy
by Gerard Morel, Mireille Raccurt
list price: $119.95
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Asin: 084930041X
Catlog: Book (2002-09-27)
Publisher: CRC Press
Sales Rank: 1518998
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Book Description

Although the polymerase chain reaction has revolutionized genetic analysis by amplifying rare nucleic acid sequences, the in situ application is the only method that allows the localization of amplified signal within tissue structure.The applications of in situ polymerase chain reaction have greatly enhanced the field of investigation in many disciplines, including viral infections, gene modification, tumor diagnosis, gene therapy, and cellular distribution of rare mRNA copies.PCR/RT-PCR in situ: Light and Electron Microscopy covers methods of in situ polymerase chain reaction (PCR) and reverse transcription PCR (RT-PCR), two new approaches in visualizing very low amounts of DNA and RNA in tissues and cell cultures at the light and electron microscopy levels. Written by experts in this field, the book provides theoretical consideration, as well as practical approaches to in situ PCR. The authors provide detailed protocols for each step, including the preparation of tissue samples, the rationale for the design of primers and revelation. They also emphasize the need for appropriate controls to meet the requirements of in situ PCR and RT-PCR specificity.Organized in a user-friendly two-column format, this book will provide you with tools necessary to perform and optimize these sensitive and powerful techniques in your research protocols. ... Read more


99. High-Field Science
list price: $152.00
our price: $152.00
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Asin: 0306463768
Catlog: Book (2001-03-01)
Publisher: Kluwer Academic/Plenum Publishers
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Book Description

High Field Science is a proceedings volume from a meeting at Lawrence Livermore Laboratory, and contains papers from the top experts in the fields of ultraintense laser technology, laser fusion energy, high energy laser electron acceleration, bright X-ray sources by lasers, laboratory laser astrophysics, and applications to relativity, high density and high energy physics. ... Read more


100. Introduction to Electron Holography
by Edgar Volkl, David C. Joy, Lawrence F. Allard
list price: $112.00
our price: $112.00
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Asin: 030644920X
Catlog: Book (1999-06-01)
Publisher: Plenum Publishing Corporation
Sales Rank: 1167805
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Book Description

Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imagingtechnology, in this superb text. The book's `how to' aspects enablereaders to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A complete bibliography on electron holography and applications of the method to problems inmaterials science, physics and the life sciences round out the volume's coverage. ... Read more


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